Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity (Iθ). Stacking such wafers is efficient in amplifying Iθ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.
- Plastically deformed Si wafer;
- Neutron monochromator;
- Neutron reflectivity;
- Mosaic crystal
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